Event 2012 - Call for Papers

CALL FOR PAPERS

Scope -- Submissions -- Key Dates -- Additional Information -- Committees

Scope

The International Design and Test Symposium explores emerging challenges and novel concepts in design, automation, test and reliability of electronic products ranging from integrated circuits through multi-chip modules and printed circuit boards to full systems and microsystems. IDT provides unique forum to discuss best practices and novel ideas in design methods, tools, test and reliability in the Middle East and Africa (MEA) region. IDT’13 will take place in Marrakesh, Morocco. The Symposium is initiated by and in affiliation with the IEEE Test Technology Technical Council (TTTC) and the 2013 edition is organized by The Delft University of Technology and technically sponsored by IEEE CEDA (Council on Electronic Design Automation). The official language of the conference is English. Topics of interest include but are not limited to:

Design Methods and Tools

SOC, SIP, NOC design
Multiprocessor systems
Embedded systems
Analog, Mixed Signal and RF systems
MEMS and MOEMS systems
Low Voltage and Low Power syst.
Innovative technologies
Real time systems
Simulation, Validation & Verification
System Specification and Modelling
Formal Methods and Verification
System Design/Synthesis/Optimization

Test and Reliability

SOC and SIP testing
Multiprocessor test
Memory & FPGA Test & repair
Delay testing
Analog and Mixed Signal testing
MEMS/MOEMS testing
Defect and fault modeling
DFT, BIST and BISR
On-line testing / fault tolerant syst.
Fault Simulation, ATPG
Reliability failures/ modeling
Circuit reliability
Electronic system reliability

Submissions

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Regular Submissions: IDT’13 invites original, unpublished paper submissions. Paper submissions should be complete manuscripts, not exceeding six pages (inclusive of figures, tables, and bibliography) in a standard IEEE two-column format. Authors should clearly explain the significance of the work, highlight novel features and describe its current status. All submissions are to be made electronically through the IDT’13 website. Detailed instructions for submissions are to be found at the IDT’13 website. A submission will be considered as evidence that, upon acceptance, the author(s) will prepare the final camera-ready version of the paper in time for inclusion in the proceedings, and will present the paper at the conference. All papers will be taken into consideration for the IDT 2013 Best Paper Award. In addition, a set of best papers will be considered for IEEE Design and Test.

Special proposals: Special Sessions can take any form such as (a) Hot-Topic session addressing and discussing the challenges in topics of interest such as Design, tools, Test and/or Reliability, (b) (Embedded) tutorials introducing and discussing topics of interest to conference attendees, (c) Panels discussing visionary and/or controversial issues, etc. Special Session proposals consist of an extended summary of up to 1500 words as PDF file, describing the session content and format, and must be submitted via electronically through the IDT’13 website.

Publications: IDT’13 will produce Formal Proceedings of accepted papers, published by the IEEE. The
proceedings will be available to all participants during the conference.

Key Dates

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Submission deadline: July 21, 2013
Notification of acceptance: September 15, 2013
Final copy deadline: November 15, 2013

Additional Information

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General Information
Said Hamdioui and/or
Yervant Zorian

Regular Submission Information
Rolf Drechsler
Paolo Prinetto
Ashraf Salem

Special Sessions Proposals Information
Matteo Sonza Reorda
Rafik Makki

Committees

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Organizing Committee

General Co-Chairs
Said Hamdioui, TU Delft (NL)
Yervant Zorian, Synopsys (USA)

Vice General Co-Chairs
Andre Ivanov, UBC (CA)
Hazem ElTahawy, Mentor (EG)

Program Co-Chairs
Rolf Drechsler, University of
Bremen/ DFKI (GE)
Paolo Prinetto, Polito (IT)
Ashraf Salem, Mentor Graphics (EG)

Vice Program Co-Chairs
Mazen A. R. Saghir, Texas A&M
University at Qatar (QA)
Smail Niar, U Valenciennes (FR)

Publicity Chairs
Bernard Courtois, CMP (FR)
Ozgur Sinanoglu, NY Uni (UAE)

Special Session Co-Chairs
Matteo Sonza Reorda, Polito (IT)
Rafik Makki, Global Foundries (USA)

TTTC Liaison
C.-H Chiang, Alcatel-Lucent (USA)
Local Arrangement Co-Chairs
M. Benbouida- ENSSUP (MA)
Organizing Committee TU Delft
Z. Alars - Chair
R. Nane- Web
M. Taouil - Proceedings
L. Trompt - Registration
S. Wong- Finance

Technical Program Committee
tbd

For more information, visit us on the web at: http://idt.tttc-events.org

The 8th IEEE International Design & Test Symposium (IDT 2013) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).